Grupo de espectroscopía, láseres y plama (G.E.L.P.)

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Publications and Awards

Publications

2017 - 2016 - 2015 - 2014 - 2013 - 2012 - 2011 - 2010 - 2009 - 2008 - 2007 - 2006 - 2005 - 2004 - 2003 - 2002 - 2001 - 2000 - 1999 - 1998 - 1997 - 1995 - 1992 - 1990

Awards

Poster Award at the "Jornadas de Análisis Instrumental" Conference, (Barcelona, November 2011). Prize given by the Spanish Society of Analytical Chemistry

Premio Investigador Novel en Física Experimental 2011 de la Real Sociedad Española de Física (Jorge Pisonero)

Richard Payling Prize 2011 (Rebeca Valledor)

Masao Horiba Award 2009 (Jorge Pisonero)

Poster Award - Chemistry Diffusion at the 2010 Oviedo University Science Week (Cristina González)

Invited lectures

  1. - J. Pisonero et al., "Trends and challenges in Glow Discharge Mass Spectrometry for Direct Analysis of Innovative Materials.", European Winter Conference on Plasma Spectrochemistry, Sankt Anton am Arlberg, Austria (February 2017)
  2. - J. Pisonero et al., "Pulsed Radiofrequency Glow Discharge Time-of-Flight Mass Spectrometry: a versatile analytical technique for fast direct solid and gas analysis", SciX 2016, Minneapolis, MN, USA (September 2016).
  3. - J. Pisonero et al., "Challenges of GD-TOFMS for direct analysis of innovative materiales", International Glow Discharge Spectroscopy Symposium (IGDSS), Liverpool, UK (18-20 April 2016).
  4. - J. Pisonero et al., "Evaluation of different strategies for laser-induced aerosol mixing and filtering in order to improve the capabilities of LA-ICP-MS", SciX 2015, Providence, Rhode Island, USA (September 2015).
  5. - N. Bordel et al., "Time regimes in pulsed RF-GD-TOFMS: properties and effects on the in-depth profile analysis of thin layers", SciX 2015, Providence, Rhode Island, USA (September 2015).
  6. - J. Pisonero et al., "Pulsed radiofrequency GD-TOFMS a powerful "toy" for depth profile analysis with high depth resolution", at Shantou University, Shantou, China; and at 6th Asia-Pacific Winter Conference on Plasma Spectrochemistry, Xiamen, China (May 2015),
  7. - N. Bordel et al., "Pulsed-rf-GD-TOFMS: A multifaceted technique for depth profiling analysis of innovative materials", 29th ISMAS International Symposium on Mass Spectrometry, Rajasthan, India (February 2015)
  8. - J. Pisoner et al., "Depth Profile Analysis of micrometer and sub-micrometer layers using LA-ICP-Ms: Pros and Cons", International Symposium on Laser Spectroscopy and Spectral Analysis, Chengdu, China (December 2014)
  9. - N. Bordel et al., "Detection of molecular emission bands by LIBS: Application to the Quantitative Analysis of Fluorite Ores", International Symposium on Laser Spectroscopy and Spectral Analysis, Chengdu, China (December 2014)
  10. - J. Orejas et al., "FAPA-APGD Desorption/Ionization Source: Influence of Temperature and Humidity on the Reagent Ion Production and Ionization Processes", SciX Conference, Reno, USA (October 2014)
  11. - N. Bordel et al., Analytical Capabilities of Pulsed rf-GD-TOFMS for Depth Profiling", SciX Conference, Reno, USA (October 2014)
  12. - J. Pisonero et al., "Analytical applications of LA-ICP-MS for spatially resolved analysis", ORQUE SUDOE Summer School "(Bio)Analytical strategies for speciation and ecotoxicity studies", Madrid, Spain (May 2014)
  13. - R. Valledor et al., "Diagnostics of pulsed glow discharges by optical emission spectroscopy", Internation Glow Discharge Spectroscopy Symposium (IGDSS), Prague, Czech Republic (April 2014)
  14. - J. Pisonero et al., "Pulsed glow discharge mass spectrometry and LA-ICP-MS for depth profiling analysis of innovative materials", Winter Conference on Plasma Spectrochemistry, Amelia Island, FL, USA (January 2014)
  15. - J. Pisonero et al., "Depth profiling and near-surface analysis by RF-PGD-TOFMS.", SCIX Conference, Milwaukee, WI, USA (October 2013)
  16. -  N. Bordel et al., "Plasmas as a tool for chemical characterization of innovative materials", Bern University of Applied Sciences, Biel, Switzerland (March 2013).
  17. - J. Pisonero et al., "Analysis and thickness determination of ultrathin layer by two complementary techniques: LA-ICP-MS and pulsed-RF-GD-TOFMS, European Winter Conference, Krakow, Poland (February 2013)
  18. - J. Pisonero et al., "Thickness determination of nm and sub-nm layers by LA-ICP-MS", Asian Pacific Winter Conference, Jeju, South Korea (August 2012)
  19. - J. Pisonero et al., "Capabilities of pulsed radiofrequency glow discharge time-of-flight mass spectrometry for direct chemical analysis of ultrathin coatings", 1st Annual Conference and Expo of Analytix-2012, Beijing, China (March 2012)
  20. - J. Pisonero et al., "Advances in pulsed radiofrequency glow discharge spectrometry",Winter Conference on Plasma Spectrochemistry, Tucson, USA (January 2012)
  21. - J. Pisonero et al., "Introduction to pulsed radiofrequency glow discharge spectrometry",General Electrics, Albany, USA (January 2012)
  22. - N. Bordel et al., "Production and Characterization of Si Materials: from Metallurgical to Solar Grade Silicon", LCES-2011 (Low carbon earth summit), Dalian, China (October 2011)
  23. - J Pisonero et al., "Characterization of nano-layered materials using a pulsed-radiofrequency glow discharge coupled to a time of flight mass", Pacifichem 2010, Honolulu, Hawaii (December 2010)
  24. - J. Pisonero et al., "Direct analysis of nanometer layers: Glow Discharge Mass Spectrometry as a possible complement to SIMS", 4th Asian-Pacific Winter Conference on Plasma Chemistry, Chengdu, China (November 2010)
  25. - N. Bordel et al., "Spatial distribution and temporal dependence of the optical emission in a pulsed radiofrequency glow discharge.", FACSS Conference, Raleigh, USA (October 2010)
  26. - J. Pisonero et al., "Depth profile capabilities of pulsed RF glow discharge TOFMS. How far are we from SIMS? ", FACSS Conference, Raleigh, USA (October 2010)
  27. - N. Bordel et al., "Radiofrequency glow discharge time of flight mass spectrometry for thin film analysis: pulsed mode versus continuous mode”, Internacional Conference and Exhibition on analysis and testing of materials, Beijing, China (November 2008)
  28. - N. Bordel et al., "Chemical analysis and characterization of nanolayers on conducting and insulating substrates by pulsed radiofrequency glow discharge time of flight mass spectrometry”, Trends in Nanotechnology, Oviedo, Spain (September 2008)
  29. - J. Pisonero et al., "Capabilities and limitations in laser ablation-ICP-MS", Anakon Conference, Jena, Germany (March 2007)
  30. - J. Pisonero et al., "Glow discharge spectroscopy for depth profile analysis of thin films", Winter Conference on Plasma Spectrochemistry, Tucson, USA (January 2006)
  31. - N. Bordel et al., "GD-OES versus GD-MS for thin film analysis", International Symposium on GDOES for Surface Analysis, Yokohama, Japan (November 2002)
  32. - J. Pisonero et al., "Thin-film analysis using pulsed and rf glow discharge with OES and TOFMS", FACSS Conference, Rhode Island, USA (October 2002)

Journal Covers

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