{"id":710,"date":"2018-08-17T08:24:50","date_gmt":"2018-08-17T06:24:50","guid":{"rendered":"http:\/\/pruebagelp.com.mialias.net\/?page_id=710"},"modified":"2025-05-29T13:11:40","modified_gmt":"2025-05-29T11:11:40","slug":"invited-lectures","status":"publish","type":"page","link":"https:\/\/www.unioviedo.es\/gelp\/invited-lectures\/","title":{"rendered":"Invited lectures"},"content":{"rendered":"<section class=\"kc-elm kc-css-739097 kc_row\"><div class=\"kc-row-container  kc-container\"><div class=\"kc-wrap-columns\"><div class=\"kc-elm kc-css-499660 kc_col-sm-12 kc_column kc_col-sm-12\"><div class=\"kc-col-container\"><div class=\"kc-elm kc-css-257118 kc_text_block\"><\/p>\n<p>Our research group members have presented several keynote and invited lectures at international and national conferences.<\/p>\n<p>A detailed list is here presented:<\/p>\n<p>\n<\/div><div class=\"kc-elm kc-css-259991\" style=\"height: 20px; clear: both; width:100%;\"><\/div><div class=\"kc-elm kc-css-282998 kc_accordion_wrapper\">\n<div class=\"kc-elm kc-css-477928 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2024\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2024<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-934879 kc_text_block\"><\/p>\n<p><b>Evaluation of the analytical performance of femtosecond laser ablation ICP-TOFMS for the direct analysis of challenging samples<\/b><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX Conference, Raleigh, NC, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2024<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-574386 kc_text_block\"><\/p>\n<p><b>Pros and Cons of LA-ICP-MS for fast, sensitive and high-spatially resolved elemental mapping of challenging samples<\/b><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>EWLA (European Workshop on Laser Ablation), Ghent, Belgium<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>July 2024<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-864527 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2023\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2023<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-269485 kc_text_block\"><\/p>\n<p>Nebulization-assisted LIBS as a potential tool for online analysis of liquids including complex halogen-containing samples<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>C. M\u00e9ndez-L\u00f3pez et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX Conference, Sparks, Nevada, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2023<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-926204 kc_text_block\"><\/p>\n<p>Evaluation of fs-LA-ICP-TOFMS for multi-matrix analysis with high spatial resolution<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX Conference, Sparks, Nevada, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2023<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-745759 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2022\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2022<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-297862 kc_text_block\"><\/p>\n<p><b>Dual fs-LIBS &#038; fs-LA-ICPTOFMS System (Not Simultaneous) for Fast and High Dynamic Range Micro-Analysis: Pros and Cons<\/b><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX Conference, Covington, Kentucky, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2022<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-122526 kc_text_block\"><\/p>\n<p>GD- and LA-ICP-(TOFMS): two powerful spectroscopy techniques for fast high spatially resolved analysis<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>European Symposium on Analytical Spectrometry ESAS 2022<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>September 2022<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-707504 kc_text_block\"><\/p>\n<p>Plasma based techniques in analytical spectroscopy<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases (ESCAMPIG)<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>July 2022<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-782449 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2019\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2019<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-929592 kc_text_block\"><\/p>\n<p>Fast and High Resolved Elemental Analysis using ns\/fs-LA: pros and cons.<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SCIX Conference, Palm Springs, USA <\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2019<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-576822 kc_text_block\"><\/p>\n<p>Glow discharge spectroscopy and laser-induced plasma spectroscopy for direct chemical characterization of solid samples<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Iberian Joint Meeting on Atomic and Molecular Physics, Evora, Alentejo, Portugal<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>July 2019<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-328931 kc_text_block\"><\/p>\n<p>Current pros and cons of GDMS and LA ICP MS for high spatially resolved analysis.<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Winter Conference on Plasma Spectrochemistry, Pau, France<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>February 2019<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-459868 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2018\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2018<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-810049 kc_text_block\"><\/p>\n<p>Evaluation of Fast and High Resolved Elemental Analysis Using LA-ICP-SFMS<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SCIX Conference, Atlanta, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2018<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-944398 kc_text_block\"><\/p>\n<p>Fast Direct Solid Analysis with High Spatial Resolution Using Pulsed-GD-MS and LA-ICP-MS: Advantages and Current Limitations.<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Winter Conference on Plasma Spectrochemistry, Amelia Island, FL, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>January 2018<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-524841 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2017\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2017 <\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-74193 kc_text_block\"><\/p>\n<p><strong>High spatially resolved analysis of coated materials by GD-MS and LA-ICP-MS.<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Asian Pacific Winter Conference, Matsue, Japan<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>November 2017<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-302798 kc_text_block\"><\/p>\n<p><strong>Glow Discharge Mass Spectrometry: A Superstar for Fast Depth Profiling.<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SCIX Conference, Reno, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2017<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><div class=\"kc-elm kc-css-126522 kc_text_block\"><\/p>\n<p><strong>Trends and challenges in Glow Discharge Mass Spectrometry for Direct Analysis of Innovative Materials.<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero et al.<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>European Winter Conference on Plasma Spectrochemistry, Sankt Anton am Arlberg, Austria<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>February 2017<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-615333 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2016\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2016<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-586787 kc_text_block\"><\/p>\n<p>\n<strong>Pulsed Radiofrequency Glow Discharge Time-of-Flight Mass Spectrometry: a versatile analytical technique for fast direct solid and gas analysis<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX 2016, Minneapolis, MN, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>September 2016<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Challenges of GD-TOFMS for direct analysis of innovative materiales<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>International Glow Discharge Spectroscopy Symposium (IGDSS), Liverpool, UK<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>18-20 April 2016<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-248090 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2015\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2015<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-610390 kc_text_block\"><\/p>\n<p>\n<strong>Evaluation of different strategies for laser-induced aerosol mixing and filtering in order to improve the capabilities of LA-ICP-M<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX 2015, Providence, Rhode Island, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>September 2015<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Time regimes in pulsed RF-GD-TOFMS: properties and effects on the in-depth profile analysis of thin layers<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX 2015, Providence, Rhode Island, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>September 2015<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Pulsed radiofrequency GD-TOFMS a powerful \u00abtoy\u00bb for depth profile analysis with high depth resolution<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>at Shantou University, Shantou, China; and at 6th Asia-Pacific Winter Conference on Plasma Spectrochemistry, Xiamen, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>May 2015<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Pulsed-rf-GD-TOFMS: A multifaceted technique for depth profiling analysis of innovative materials<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>29th ISMAS International Symposium on Mass Spectrometry, Rajasthan, India<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>February 2015<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-487897 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2014\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2014<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-997788 kc_text_block\"><\/p>\n<p>\n<strong>Depth Profile Analysis of micrometer and sub-micrometer layers using LA-ICP-Ms: Pros and Cons<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>International Symposium on Laser Spectroscopy and Spectral Analysis, Chengdu, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>December 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Detection of molecular emission bands by LIBS: Application to the Quantitative Analysis of Fluorite Ore<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>International Symposium on Laser Spectroscopy and Spectral Analysis, Chengdu, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>December 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>FAPA-APGD Desorption\/Ionization Source: Influence of Temperature and Humidity on the Reagent Ion Production and Ionization Processes<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Orejas<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX Conference, Reno, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Analytical Capabilities of Pulsed rf-GD-TOFMS for Depth Profiling<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SciX Conference, Reno, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Analytical applications of LA-ICP-MS for spatially resolved analysis<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>ORQUE SUDOE Summer School \u00ab(Bio)Analytical strategies for speciation and ecotoxicity studies\u00bb, Madrid, Spain<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>May 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Diagnostics of pulsed glow discharges by optical emission spectroscopy<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>R. Valledor<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Internation Glow Discharge Spectroscopy Symposium (IGDSS), Prague, Czech Republic<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>April 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Pulsed glow discharge mass spectrometry and LA-ICP-MS for depth profiling analysis of innovative materials<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Winter Conference on Plasma Spectrochemistry, Amelia Island, FL, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>January 2014<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-343934 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2013\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2013<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-614214 kc_text_block\"><\/p>\n<p>\n<strong>Depth profiling and near-surface analysis by RF-PGD-TOFMS<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>SCIX Conference, Milwaukee, WI, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2013<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Plasmas as a tool for chemical characterization of innovative materials<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Bern University of Applied Sciences, Biel, Switzerland<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>March 2013<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Analysis and thickness determination of ultrathin layer by two complementary techniques: LA-ICP-MS and pulsed-RF-GD-TOFMS<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>European Winter Conference, Krakow, Poland<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>February 2013<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-722022 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2012\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2012<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-546082 kc_text_block\"><\/p>\n<p>\n<strong>Thickness determination of nm and sub-nm layers by LA-ICP-MS<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Asian Pacific Winter Conference, Jeju, South Korea<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>August 2012<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>Capabilities of pulsed radiofrequency glow discharge time-of-flight mass spectrometry for direct chemical analysis of ultrathin coatings<\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>1st Annual Conference and Expo of Analytix-2012, Beijing, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>AMarch 2012<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Introduction to pulsed radiofrequency glow discharge spectrometry<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>General Electrics, Albany, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>January 2012<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-224958 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2011\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2011<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-536056 kc_text_block\"><\/p>\n<p>\n<strong>Production and Characterization of Si Materials: from Metallurgical to Solar Grade Silicon<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>LCES-2011 (Low carbon earth summit), Dalian, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2011<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-500898 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2010\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2010<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-792872 kc_text_block\"><\/p>\n<p>\n<strong>Characterization of nano-layered materials using a pulsed-radiofrequency glow discharge coupled to a time of flight mass<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Pacifichem 2010, Honolulu, Hawaii<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>December 2010<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Direct analysis of nanometer layers: Glow Discharge Mass Spectrometry as a possible complement to SIMS<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>4th Asian-Pacific Winter Conference on Plasma Chemistry, Chengdu, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>November 2010<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Spatial distribution and temporal dependence of the optical emission in a pulsed radiofrequency glow discharge<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Borde<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>FACSS Conference, Raleigh, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2010<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Depth profile capabilities of pulsed RF glow discharge TOFMS. How far are we from SIMS?<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Title<\/th>\n<td><\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>FACSS Conference, Raleigh, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>October 2010<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-622031 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2008\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2008<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-748436 kc_text_block\"><\/p>\n<p>\n<strong>Radiofrequency glow discharge time of flight mass spectrometry for thin film analysis: pulsed mode versus continuous mode<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Internacional Conference and Exhibition on analysis and testing of materials, Beijing, China<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>November 2008<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Chemical analysis and characterization of nanolayers on conducting and insulating substrates by pulsed radiofrequency glow discharge time\u00a0of flight mass spectrometry<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Trends in Nanotechnology, Oviedo, Spain<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>September 2008<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-628284 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2007\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2007<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-433775 kc_text_block\"><\/p>\n<p>\n<strong>Capabilities and limitations in laser ablation-ICP-MS<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Anakon Conference, Jena, Germany<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>March 2007<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-508414 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2006\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2006<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-826738 kc_text_block\"><\/p>\n<p>\n<strong>Glow discharge spectroscopy for depth profile analysis of thin films<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place<\/th>\n<td>Winter Conference on Plasma Spectrochemistry, Tucson, USA<\/td>\n<\/tr>\n<tr>\n<th>Date<\/th>\n<td>January 2006<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><div class=\"kc-elm kc-css-662847 kc_accordion_section group \"><h3 class=\"kc_accordion_header ui-accordion-header\"><span class=\"ui-accordion-header-icon ui-icon\"><\/span><a href=\"#2002\" data-prevent=\"scroll\"><i class=\"sl-book-open\"><\/i> 2002<\/a><\/h3><div class=\"kc_accordion_content ui-accordion-content kc_clearfix\"><div class=\"kc-panel-body\"><div class=\"kc-elm kc-css-824736 kc_text_block\"><\/p>\n<p>\n<strong>GD-OES versus GD-MS for thin film analysis<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author(s):<\/th>\n<td>N. Bordel<\/td>\n<\/tr>\n<tr>\n<th>Place:<\/th>\n<td>International Symposium on GDOES for Surface Analysis, Yokohama, Japan<\/td>\n<\/tr>\n<tr>\n<th>Date:<\/th>\n<td>November 2002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p><strong>Thin-film analysis using pulsed and rf glow discharge with OES and TOFMS<\/strong><\/p>\n<table>\n<tbody>\n<tr>\n<th>Author(s):<\/th>\n<td>J. Pisonero<\/td>\n<\/tr>\n<tr>\n<th>Place:<\/th>\n<td>FACSS Conference, Rhode Island, USA<\/td>\n<\/tr>\n<tr>\n<th>Date:<\/th>\n<td>October 2002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>\n<\/div><\/div><\/div><\/div><\/div>\n<\/div><\/div><\/div><\/div><\/section>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":4,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-710","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/pages\/710","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/comments?post=710"}],"version-history":[{"count":55,"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/pages\/710\/revisions"}],"predecessor-version":[{"id":2702,"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/pages\/710\/revisions\/2702"}],"wp:attachment":[{"href":"https:\/\/www.unioviedo.es\/gelp\/wp-json\/wp\/v2\/media?parent=710"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}