Our research group members have presented several keynote and invited lectures at international and national conferences.
A detailed list is here presented:
2019
Fast and High Resolved Elemental Analysis using ns/fs-LA: pros and cons.
| Author | J. Pisonero et al. |
|---|---|
| Place | SCIX Conference, Palm Springs, USA |
| Date | October 2019 |
Glow discharge spectroscopy and laser-induced plasma spectroscopy for direct chemical characterization of solid samples
| Author | J. Pisonero et al. |
|---|---|
| Place | Iberian Joint Meeting on Atomic and Molecular Physics, Evora, Alentejo, Portugal |
| Date | July 2019 |
Current pros and cons of GDMS and LA ICP MS for high spatially resolved analysis.
| Author | J. Pisonero et al. |
|---|---|
| Place | Winter Conference on Plasma Spectrochemistry, Pau, France |
| Date | February 2019 |
2018
Evaluation of Fast and High Resolved Elemental Analysis Using LA-ICP-SFMS
| Author | J. Pisonero et al. |
|---|---|
| Place | SCIX Conference, Atlanta, USA |
| Date | October 2018 |
Fast Direct Solid Analysis with High Spatial Resolution Using Pulsed-GD-MS and LA-ICP-MS: Advantages and Current Limitations.
| Author | J. Pisonero et al. |
|---|---|
| Place | Winter Conference on Plasma Spectrochemistry, Amelia Island, FL, USA |
| Date | January 2018 |
2017
High spatially resolved analysis of coated materials by GD-MS and LA-ICP-MS.
| Author | J. Pisonero et al. |
|---|---|
| Place | Asian Pacific Winter Conference, Matsue, Japan |
| Date | November 2017 |
Glow Discharge Mass Spectrometry: A Superstar for Fast Depth Profiling.
| Author | J. Pisonero et al. |
|---|---|
| Place | SCIX Conference, Reno, USA |
| Date | October 2017 |
Trends and challenges in Glow Discharge Mass Spectrometry for Direct Analysis of Innovative Materials.
| Author | J. Pisonero et al. |
|---|---|
| Place | European Winter Conference on Plasma Spectrochemistry, Sankt Anton am Arlberg, Austria |
| Date | February 2017 |
2016
Pulsed Radiofrequency Glow Discharge Time-of-Flight Mass Spectrometry: a versatile analytical technique for fast direct solid and gas analysis
| Author | J. Pisonero |
|---|---|
| Place | SciX 2016, Minneapolis, MN, USA |
| Date | September 2016 |
Challenges of GD-TOFMS for direct analysis of innovative materiales
| Author | J. Pisonero |
|---|---|
| Place | International Glow Discharge Spectroscopy Symposium (IGDSS), Liverpool, UK |
| Date | 18-20 April 2016 |
2015
Evaluation of different strategies for laser-induced aerosol mixing and filtering in order to improve the capabilities of LA-ICP-M
| Author | J. Pisonero |
|---|---|
| Place | SciX 2015, Providence, Rhode Island, USA |
| Date | September 2015 |
Time regimes in pulsed RF-GD-TOFMS: properties and effects on the in-depth profile analysis of thin layers
| Author | N. Bordel |
|---|---|
| Place | SciX 2015, Providence, Rhode Island, USA |
| Date | September 2015 |
Pulsed radiofrequency GD-TOFMS a powerful «toy» for depth profile analysis with high depth resolution
| Author | J. Pisonero |
|---|---|
| Place | at Shantou University, Shantou, China; and at 6th Asia-Pacific Winter Conference on Plasma Spectrochemistry, Xiamen, China |
| Date | May 2015 |
Pulsed-rf-GD-TOFMS: A multifaceted technique for depth profiling analysis of innovative materials
| Author | N. Bordel |
|---|---|
| Place | 29th ISMAS International Symposium on Mass Spectrometry, Rajasthan, India |
| Date | February 2015 |
2014
Depth Profile Analysis of micrometer and sub-micrometer layers using LA-ICP-Ms: Pros and Cons
| Author | J. Pisonero |
|---|---|
| Place | International Symposium on Laser Spectroscopy and Spectral Analysis, Chengdu, China |
| Date | December 2014 |
Detection of molecular emission bands by LIBS: Application to the Quantitative Analysis of Fluorite Ore
| Author | N. Bordel |
|---|---|
| Place | International Symposium on Laser Spectroscopy and Spectral Analysis, Chengdu, China |
| Date | December 2014 |
FAPA-APGD Desorption/Ionization Source: Influence of Temperature and Humidity on the Reagent Ion Production and Ionization Processes
| Author | J. Orejas |
|---|---|
| Place | SciX Conference, Reno, USA |
| Date | October 2014 |
Analytical Capabilities of Pulsed rf-GD-TOFMS for Depth Profiling
| Author | N. Bordel |
|---|---|
| Place | SciX Conference, Reno, USA |
| Date | October 2014 |
Analytical applications of LA-ICP-MS for spatially resolved analysis
| Author | J. Pisonero |
|---|---|
| Place | ORQUE SUDOE Summer School «(Bio)Analytical strategies for speciation and ecotoxicity studies», Madrid, Spain |
| Date | May 2014 |
Diagnostics of pulsed glow discharges by optical emission spectroscopy
| Author | R. Valledor |
|---|---|
| Place | Internation Glow Discharge Spectroscopy Symposium (IGDSS), Prague, Czech Republic |
| Date | April 2014 |
Pulsed glow discharge mass spectrometry and LA-ICP-MS for depth profiling analysis of innovative materials
| Author | J. Pisonero |
|---|---|
| Place | Winter Conference on Plasma Spectrochemistry, Amelia Island, FL, USA |
| Date | January 2014 |
2013
Depth profiling and near-surface analysis by RF-PGD-TOFMS
| Author | J. Pisonero |
|---|---|
| Place | SCIX Conference, Milwaukee, WI, USA |
| Date | October 2013 |
Plasmas as a tool for chemical characterization of innovative materials
| Author | N. Bordel |
|---|---|
| Place | Bern University of Applied Sciences, Biel, Switzerland |
| Date | March 2013 |
Analysis and thickness determination of ultrathin layer by two complementary techniques: LA-ICP-MS and pulsed-RF-GD-TOFMS
| Author | J. Pisonero |
|---|---|
| Place | European Winter Conference, Krakow, Poland |
| Date | February 2013 |
2012
Thickness determination of nm and sub-nm layers by LA-ICP-MS
| Author | J. Pisonero |
|---|---|
| Place | Asian Pacific Winter Conference, Jeju, South Korea |
| Date | August 2012 |
Capabilities of pulsed radiofrequency glow discharge time-of-flight mass spectrometry for direct chemical analysis of ultrathin coatings
| Author | J. Pisonero |
|---|---|
| Place | 1st Annual Conference and Expo of Analytix-2012, Beijing, China |
| Date | AMarch 2012 |
Introduction to pulsed radiofrequency glow discharge spectrometry
| Author | J. Pisonero |
|---|---|
| Place | General Electrics, Albany, USA |
| Date | January 2012 |
2011
Production and Characterization of Si Materials: from Metallurgical to Solar Grade Silicon
| Author | N. Bordel |
|---|---|
| Place | LCES-2011 (Low carbon earth summit), Dalian, China |
| Date | October 2011 |
2010
Characterization of nano-layered materials using a pulsed-radiofrequency glow discharge coupled to a time of flight mass
| Author | J Pisonero |
|---|---|
| Place | Pacifichem 2010, Honolulu, Hawaii |
| Date | December 2010 |
Direct analysis of nanometer layers: Glow Discharge Mass Spectrometry as a possible complement to SIMS
| Author | J Pisonero |
|---|---|
| Place | 4th Asian-Pacific Winter Conference on Plasma Chemistry, Chengdu, China |
| Date | November 2010 |
Spatial distribution and temporal dependence of the optical emission in a pulsed radiofrequency glow discharge
| Author | N. Borde |
|---|---|
| Place | FACSS Conference, Raleigh, USA |
| Date | October 2010 |
Depth profile capabilities of pulsed RF glow discharge TOFMS. How far are we from SIMS?
| Author | J. Pisonero |
|---|---|
| Title | |
| Place | FACSS Conference, Raleigh, USA |
| Date | October 2010 |
2008
Radiofrequency glow discharge time of flight mass spectrometry for thin film analysis: pulsed mode versus continuous mode
| Author | N. Bordel |
|---|---|
| Place | Internacional Conference and Exhibition on analysis and testing of materials, Beijing, China |
| Date | November 2008 |
Chemical analysis and characterization of nanolayers on conducting and insulating substrates by pulsed radiofrequency glow discharge time of flight mass spectrometry
| Author | N. Bordel |
|---|---|
| Place | Trends in Nanotechnology, Oviedo, Spain |
| Date | September 2008 |
2007
Capabilities and limitations in laser ablation-ICP-MS
| Author | J. Pisonero |
|---|---|
| Place | Anakon Conference, Jena, Germany |
| Date | March 2007 |
2006
Glow discharge spectroscopy for depth profile analysis of thin films
| Author | J. Pisonero |
|---|---|
| Place | Winter Conference on Plasma Spectrochemistry, Tucson, USA |
| Date | January 2006 |
2002
GD-OES versus GD-MS for thin film analysis
| Author(s): | N. Bordel |
|---|---|
| Place: | International Symposium on GDOES for Surface Analysis, Yokohama, Japan |
| Date: | November 2002 |
Thin-film analysis using pulsed and rf glow discharge with OES and TOFMS
| Author(s): | J. Pisonero |
|---|---|
| Place: | FACSS Conference, Rhode Island, USA |
| Date: | October 2002 |